Non-destructive Testing of Luminescent Diodes by Noise

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30671" target="_blank" >RIV/00216305:26220/02:PU30671 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Non-destructive Testing of Luminescent Diodes by Noise

Original language description

Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Results of microplasma noise studying may be used for p-n junction non-destructive diagnostics annd quality assessment.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA103%2F01%2F1058" target="_blank" >GA103/01/1058: Electromagnetic and acoustic emission in solids</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2002

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

8-th ECNDT

ISBN

84-699-8573-6

ISSN

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e-ISSN

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Number of pages

1

Pages from-to

247-247

Publisher name

European Federation for Non-Destructive Testing

Place of publication

Madrid

Event location

Madrid

Event date

Jun 17, 2002

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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