An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39274" target="_blank" >RIV/00216305:26220/03:PU39274 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors
Original language description
In this paper we present an investigation of the long-term stability, the noise index (Quan-Tech Noise), and the nonlinearity iof small, thick-film resistors made with two high0ohmic (100 kOhm/sq. nominal sheet resistivity) thick-film resisotrs materialsand terminated with two conductor materials (Ag/Pd and low-coist Ag). The results showed that the thick-film resistor paste 2051 has a better long-term stability and a lower current noise than the HS8049 resistor paste.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Noise and Non-linearity Testing of Modern Electronic Components
ISBN
80-238-9094-8
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
40-43
Publisher name
CNRL
Place of publication
Brno
Event location
Brno
Event date
Aug 12, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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