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An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39274" target="_blank" >RIV/00216305:26220/03:PU39274 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors

  • Original language description

    In this paper we present an investigation of the long-term stability, the noise index (Quan-Tech Noise), and the nonlinearity iof small, thick-film resistors made with two high0ohmic (100 kOhm/sq. nominal sheet resistivity) thick-film resisotrs materialsand terminated with two conductor materials (Ag/Pd and low-coist Ag). The results showed that the thick-film resistor paste 2051 has a better long-term stability and a lower current noise than the HS8049 resistor paste.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Noise and Non-linearity Testing of Modern Electronic Components

  • ISBN

    80-238-9094-8

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    40-43

  • Publisher name

    CNRL

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Aug 12, 2001

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article