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Testing of Substrate and Conduct Layers of the Thick Film Structures

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU39405" target="_blank" >RIV/00216305:26220/03:PU39405 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Testing of Substrate and Conduct Layers of the Thick Film Structures

  • Original language description

    This paper shows an overview of description of the methods which is used for testing the structure of the substrate and the conduct layers of the thick film technology. This is apart of a thesis that belong to the Thick Film Technology used for producingthe biosensor.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the Socrates Workshop 2003. Intensive Training Programme in Electronic System Design.

  • ISBN

    80-214-2461-3

  • ISSN

  • e-ISSN

  • Number of pages

    9

  • Pages from-to

    120-128

  • Publisher name

    Technological Institute of Crete

  • Place of publication

    Chania, Greece

  • Event location

    Technological Institute of Crete, Chania, Greece

  • Event date

    Sep 22, 2003

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article