Local Instabilities In GaAsP Diode PN Junctions
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU51463" target="_blank" >RIV/00216305:26220/05:PU51463 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Local Instabilities In GaAsP Diode PN Junctions
Original language description
Currently, the occurrence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogeneous junction regions. The existence of such regions may lead to local avalanche breakdowns occurring in reverse-biased PN junctions at certain voltages. Macroscopically, these breakdowns are manifested as microplasma noise. Studying the current conductivity bistable mechanism thus maay be used as an efficient tool to evaluate the PN junction inhomogeneity.
Czech name
Lokální nestability v PN přechodu GaAsP diod
Czech description
Currently, the occurrence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogeneous junction regions. The existence of such regions may lead to local avalanche breakdowns occurring in reverse-biased PN junctions at certain voltages. Macroscopically, these breakdowns are manifested as microplasma noise. Studying the current conductivity bistable mechanism thus maay be used as an efficient tool to evaluate the PN junction inhomogeneity.
Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Noise and Fluctuations, 18th conference on Noise and Fluctuations - ICNF 05
ISBN
0-7354-0267-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
393-396
Publisher name
American Institute of Physics
Place of publication
Salamanca, Spain
Event location
Salamanca, Spain
Event date
Sep 19, 2005
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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