Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU52124" target="_blank" >RIV/00216305:26220/05:PU52124 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors
Original language description
The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperaturedependences.
Czech name
Transportní a šumové charakteristiky NbO a tantalových kondenzátorů
Czech description
The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperaturedependences.
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Capacitor and Resistor Technology
ISSN
0887-7491
e-ISSN
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Volume of the periodical
2005
Issue of the periodical within the volume
10
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
210-215
UT code for WoS article
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EID of the result in the Scopus database
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