NMOS electrical characterization
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU54409" target="_blank" >RIV/00216305:26220/05:PU54409 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
NMOS electrical characterization
Original language description
The HSPICE model parameters extraction of submicrometer NMOS structure is presented. The selected electrical curves are generated by parametrized device simulator DESSIS and substitute for the measured ones in an optimization HSPICE procedure. Electricalsimulator HSPICE extracts parameter numerical values of built-in model, simulates electrical curves on the basis of extracted parameters and displays the results. The individual steps to create, mesh and simulate device structure, transform DESSIS outp put data, extract model parameter values and evaluate results are described.
Czech name
NMOS electrical characterization
Czech description
The HSPICE model parameters extraction of submicrometer NMOS structure is presented. The selected electrical curves are generated by parametrized device simulator DESSIS and substitute for the measured ones in an optimization HSPICE procedure. Electricalsimulator HSPICE extracts parameter numerical values of built-in model, simulates electrical curves on the basis of extracted parameters and displays the results. The individual steps to create, mesh and simulate device structure, transform DESSIS outp put data, extract model parameter values and evaluate results are described.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Socrates Workshop 2005, Intensive Training Programme in Electronic System Design - Proceedings
ISBN
80-214-3042-7
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
72-76
Publisher name
Nakl. Novotný
Place of publication
Brno
Event location
Chania, Crete, Greece
Event date
Sep 21, 2005
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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