Electrical model parameter correlations assesment using DESSIS
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU54411" target="_blank" >RIV/00216305:26220/05:PU54411 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Electrical model parameter correlations assesment using DESSIS
Original language description
The electrical model parameter extraction methodology proffitting from DESSIS device simulation techniques and HSPICE optimization procedures is presented. The described method based on the DESSIS-HSPICE link enables to search HSPICE model parameter correlations due to technology parameters variation. The link is capable to transform large amounts of data from DESSIS to HSPICE needed in described simple experiment. The electrical model parameters dependence on selected diode technology parameter is caalculated and displayed. The individual steps to create, mesh, and simulate diode structure, transform electrical data from DESSIS to HSPICE, extract model parameters for each technology parameter value and display the results are described.
Czech name
Electrical model parameter correlations assesment using DESSIS
Czech description
The electrical model parameter extraction methodology proffitting from DESSIS device simulation techniques and HSPICE optimization procedures is presented. The described method based on the DESSIS-HSPICE link enables to search HSPICE model parameter correlations due to technology parameters variation. The link is capable to transform large amounts of data from DESSIS to HSPICE needed in described simple experiment. The electrical model parameters dependence on selected diode technology parameter is caalculated and displayed. The individual steps to create, mesh, and simulate diode structure, transform electrical data from DESSIS to HSPICE, extract model parameters for each technology parameter value and display the results are described.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Socrates Workshop 2005, Intensive Training Programme in Electronic System Design - Proceedings
ISBN
80-214-3042-7
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
68-71
Publisher name
Nakl. Novotný
Place of publication
Brno
Event location
Chania, Crete, Greece
Event date
Sep 21, 2005
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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