Bipolar transistor structure electrical characterization
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU54410" target="_blank" >RIV/00216305:26220/05:PU54410 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Bipolar transistor structure electrical characterization
Original language description
The bipolar transistor model parameters extraction method based on device simulator generated electrical characteristics is presented. The forward active region electrical characteristics generated by device simulator DESSIS substitute for the measured ones. The methodology links the device simulator DESSIS and electrical simulator HSPICE and enables to extract parameter numerical values of HSPICE built-in bipolar transistor model. The individual steps to create bipolar transistor structure, generaate corresponding mesh, simulate device structure, convert electrical data from DESSIS to HSPICE, extract model parameter values and evaluate the results are described.
Czech name
Bipolar transistor structure electrical characterization
Czech description
The bipolar transistor model parameters extraction method based on device simulator generated electrical characteristics is presented. The forward active region electrical characteristics generated by device simulator DESSIS substitute for the measured ones. The methodology links the device simulator DESSIS and electrical simulator HSPICE and enables to extract parameter numerical values of HSPICE built-in bipolar transistor model. The individual steps to create bipolar transistor structure, generaate corresponding mesh, simulate device structure, convert electrical data from DESSIS to HSPICE, extract model parameter values and evaluate the results are described.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Socrates Workshop 2005, Intensive Training Programme in Electronic System Design - Proceedings
ISBN
80-214-3042-7
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
63-67
Publisher name
Nakl. Novotný
Place of publication
Brno
Event location
Chania, Crete, Greece
Event date
Sep 21, 2005
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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