Near-field optical measurement and sensing in Nanophotonics

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F06%3APU62150" target="_blank" >RIV/00216305:26220/06:PU62150 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Near-field optical measurement and sensing in Nanophotonics

Original language description

The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives foroptical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent ellectromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices.

Czech name

Využití metod optického blízkého pole pro měření a senzory v nanofotonice

Czech description

The current progress in semiconductor optoelectronics, laser diodes, fast photodetectors, optical modulators, MEMS and MOEMS technology, micro- and nano-electronics development and optical manufacturing technology opens new and improved perspectives foroptical sensors and measuring systems, which integrate several components in order to achieve new functionalities. To measure local characteristics of these devices, the use of near-field optics is very important because the coupling of the evanescent ellectromagnetic field and the radiative electromagnetic waves in the vicinity of a nano-probe placed near the boundary between allows overcome the diffraction limit of light of conventional optics. This technique could be useful to the measurement and sensing of local optical and electro-optical characteristics in nanoscience. The paper brings an overview of several methods using the contrast mechanisms in optical near-field to characterize nanophotonic devices.

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2006

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proc. of the Symposium on Photonics Technology for the 7th Framework Programme

ISBN

83-7085-970-4

ISSN

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e-ISSN

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Number of pages

4

Pages from-to

51-54

Publisher name

Wroclaw University of Technology

Place of publication

Wroclaw, Poland

Event location

Wroclaw

Event date

Oct 11, 2006

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

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