Microplasma Noise - Coefficients of Generation and Recombination
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU68519" target="_blank" >RIV/00216305:26220/07:PU68519 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Microplasma Noise - Coefficients of Generation and Recombination
Original language description
The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions [1]. The existenceof such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns may exhibit as a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and pulse origin time points. The current impulse noise is dependent on voltage. When the reverse voltage on PN junction increases, frequency and width of impulses are also increasing. The microplasma bistable behaviour may be described with two-state stochastic process of generation-recombination type.
Czech name
Šum mikroplazmy
Czech description
The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions [1]. The existenceof such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns may exhibit as a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and pulse origin time points. The current impulse noise is dependent on voltage. When the reverse voltage on PN junction increases, frequency and width of impulses are also increasing. The microplasma bistable behaviour may be described with two-state stochastic process of generation-recombination type.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F06%2F1551" target="_blank" >GA102/06/1551: Diagnostics of PN junction electronic devices by means of microplasma noise evaluation</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2007
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Student EEICT 2007
ISBN
978-80-214-3409-7
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
356-359
Publisher name
Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno
Place of publication
Brno
Event location
Brno
Event date
Apr 26, 2007
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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