Ageing of Semiconductor Single Crystals and Metal-Semiconductor Junctions
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F08%3APU74425" target="_blank" >RIV/00216305:26220/08:PU74425 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Ageing of Semiconductor Single Crystals and Metal-Semiconductor Junctions
Original language description
CdTe radiation detectors resistance were periodically measured during long time interval with an applied voltage in range U=1V to U=30V. In 1,5 years of measurements we observed the aging of the homogenous semiconductor and metal-semiconductor junction.The resistance of the semiconductor increased significantly. The metal-semiconductor junction working in forward bias had much higher value of voltage drop than it must have had. Volt-ampere characteristics were not stable and significantly changed in small periods of time. Dependence of the resistance also was unstable.
Czech name
Stárnuti polovodičových monokrystalů a přechodů kov - polovodič
Czech description
CdTe radiation detectors resistance were periodically measured during long time interval with an applied voltage in range U=1V to U=30V. In 1,5 years of measurements we observed the aging of the homogenous semiconductor and metal-semiconductor junction.The resistance of the semiconductor increased significantly. The metal-semiconductor junction working in forward bias had much higher value of voltage drop than it must have had. Volt-ampere characteristics were not stable and significantly changed in small periods of time. Dependence of the resistance also was unstable.
Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F07%2F0113" target="_blank" >GA102/07/0113: Noise as Diagnostic Tool for Schottky and Could Electron Emission Cathodes</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2008
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
ISSE 2008 Reliability and Life-time Prediction
ISBN
978-963-06-4915-5
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Zsolt Illyefalvi-Vitez
Place of publication
Budapest, Hungary
Event location
Budapest
Event date
May 7, 2008
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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