Ta and NbO High Voltage Capacitors: Leakage Current Kinetics for MnO2 and Conducting Polymer Cathode

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU81972" target="_blank" >RIV/00216305:26220/09:PU81972 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Ta and NbO High Voltage Capacitors: Leakage Current Kinetics for MnO2 and Conducting Polymer Cathode

Original language description

An analysis of the charge carrier transport in the high voltage Ta and NbO capacitors was performed to analyze the leakage current kinetics at high temperature and high electric field for MnO2 and Conducting Polymer (CP) cathode. VA characteristics in normal and reverse mode in the temperature range from 27 to 120 C have been measured to analyze the changes of the MIS model parameters for MnO2 and CP cathodes. During the ageing at rated voltage up to the temperature 50 C the DCL is constant or slightlydecreasing with the slope 1 to 100 fA/s. At the temperature 380 K (107 C) DCL is stable for MnO2 cathode (in some samples is slightly decreasing) during a period of 1 to 10 days. We have observed for the CP cathode that DCL is increasing with the slope 0.1 to 3.0 pA/s for the first day of ageing and then the DCL increases with the slope about 3 to 5 time higher. The activation energy for MnO2 cathode is 0.55 to 0.45 eV while for CP cathode this is 0.1 to 0.2 eV. The low value of CP catho

Czech name

Ta and NbO High Voltage Capacitors: Leakage Current Kinetics for MnO2 and Conducting Polymer Cathode

Czech description

An analysis of the charge carrier transport in the high voltage Ta and NbO capacitors was performed to analyze the leakage current kinetics at high temperature and high electric field for MnO2 and Conducting Polymer (CP) cathode. VA characteristics in normal and reverse mode in the temperature range from 27 to 120 C have been measured to analyze the changes of the MIS model parameters for MnO2 and CP cathodes. During the ageing at rated voltage up to the temperature 50 C the DCL is constant or slightlydecreasing with the slope 1 to 100 fA/s. At the temperature 380 K (107 C) DCL is stable for MnO2 cathode (in some samples is slightly decreasing) during a period of 1 to 10 days. We have observed for the CP cathode that DCL is increasing with the slope 0.1 to 3.0 pA/s for the first day of ageing and then the DCL increases with the slope about 3 to 5 time higher. The activation energy for MnO2 cathode is 0.55 to 0.45 eV while for CP cathode this is 0.1 to 0.2 eV. The low value of CP catho

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastic Phenomena in MIS and MIM Semiconductor Structures</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

CARTS USA 2009 Proceedings

ISBN

0-7908-0122-1

ISSN

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e-ISSN

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Number of pages

9

Pages from-to

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Publisher name

ECA

Place of publication

U.S.A.

Event location

Jacksonville, FL

Event date

Mar 30, 2009

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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