IONS ELECTROMIGRATION IN TANTALUM CAPACITORS

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU101138" target="_blank" >RIV/00216305:26220/12:PU101138 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
IONS ELECTROMIGRATION IN TANTALUM CAPACITORS
Original language description
Electromigration of mobile ions in tantalum capacitors at various temperatures and biases was investigated. An analysis of the charge carrier transport was performed to describe the leakage current (DCL) kinetics at high temperature and high electric field for MnO2 and conducting polymer (CP) cathodes. I-V characteristics in normal and reverse mode in the temperature range from 27 to 140 C have been measured. These experiments were used to determine how the capacitor MIS model parameters are changed during ageing at elevated temperature and to receive information on the DCL conduction mechanism. The leakage current changes in the high electric field and at the elevated temperature could be divided into three time intervals: (i) DCL is stable (in some samples is slightly changing) during a period up to 200 hours, (ii) DCL increases with the slope 5 to10 pA/s for time interval about 100 hours, (iii) DCL is stable or slightly increases with the slope less than 1 pA/s. The DCL values after
Czech name
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Czech description
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Project
<a href="/en/project/EE2.3.09.0214" target="_blank" >EE2.3.09.0214: Incubator of research teams in Physical Electronics and Nanotechnology</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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