Leakage Current and Noise reliability indicators for Leakage Current and Noise reliability indicators for Ta and NbO Low Voltage Capacitors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89314" target="_blank" >RIV/00216305:26220/10:PU89314 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

čeština

Original language name

Leakage Current and Noise reliability indicators for Ta and NbO Low Voltage Capacitors

Original language description

An analysis of charge carrier transport and noise of low voltage Ta and NbO capacitors was performed at room and elevated temperature for MnO2 and Conducting Polymer (CP) cathode. VA characteristics and noise in normal and reverse mode in temperature range from 27 to 105 C have been measured to analyze the changes of the MIS model parameters for MnO2 and CP cathodes. During ageing at rated voltage up to temperature 50 C the leakage current and noise spectral density are constant or slightly increasing.Leakage current is for MnO2 and CP cathode at temperature 105 C for some samples increasing during a period of more than 10 days. Samples with high value of noise spectral density at room temperature revile higher current non stability. Value of noise voltage dispersion and spectral density at room temperature can be use as a quality and reliability indicator. Leakage current has two components: the first corresponds to electron transport through ideal insulator structure and the second

Czech name

Leakage Current and Noise reliability indicators for Ta and NbO Low Voltage Capacitors

Czech description

An analysis of charge carrier transport and noise of low voltage Ta and NbO capacitors was performed at room and elevated temperature for MnO2 and Conducting Polymer (CP) cathode. VA characteristics and noise in normal and reverse mode in temperature range from 27 to 105 C have been measured to analyze the changes of the MIS model parameters for MnO2 and CP cathodes. During ageing at rated voltage up to temperature 50 C the leakage current and noise spectral density are constant or slightly increasing.Leakage current is for MnO2 and CP cathode at temperature 105 C for some samples increasing during a period of more than 10 days. Samples with high value of noise spectral density at room temperature revile higher current non stability. Value of noise voltage dispersion and spectral density at room temperature can be use as a quality and reliability indicator. Leakage current has two components: the first corresponds to electron transport through ideal insulator structure and the second

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastic Phenomena in MIS and MIM Semiconductor Structures</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2010

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

CARTS USA 2010 PROCEEDINGS

ISBN

0-7908-0150-7

ISSN

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e-ISSN

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Number of pages

12

Pages from-to

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Publisher name

Electronic Components Association

Place of publication

USA,New Orleans

Event location

New Orleans

Event date

Mar 15, 2010

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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