LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU89315" target="_blank" >RIV/00216305:26220/10:PU89315 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs
Original language description
The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluationthat the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrierheights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are
Czech name
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Czech description
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Project
<a href="/en/project/GA102%2F09%2F1920" target="_blank" >GA102/09/1920: Stochastic Phenomena in MIS and MIM Semiconductor Structures</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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