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Electron Transport in Ta Nanolayers: Application to Tantalum Capacitors

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU86946" target="_blank" >RIV/00216305:26220/10:PU86946 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Electron Transport in Ta Nanolayers: Application to Tantalum Capacitors

  • Original language description

    The leakage current value for the various temperatures and applied voltage are frequently used as the reliability indicator for tantalum capacitors. Leakage current provides the information on the insulating layer thickness, its homogeneity and the number of defects in tested sample. In the insulating layer there are defects, which are responsible for the value and time evolution of the leakage current. The leakage current is a result of the random process of charge carrier transport and its DC component gives then information about the first statistical moment of this process. Capacitor structure can be in the first approximation considered as an ideal metal-insulator-semiconductor (MIS) structure. MIS structure model for tantalum capacitors with manganese dioxide cathode can be modified on the base of this leakage current analysis.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Polymer Electronics and Nanotechnologies: towards System Integration

  • ISBN

    978-83-7207-874-2

  • ISSN

  • e-ISSN

  • Number of pages

    3

  • Pages from-to

    137-139

  • Publisher name

    Piotr Firek, Ryszard Kisiel

  • Place of publication

    Koszykowa 75 00 662 Warsaw Poland

  • Event location

    Tatranská Lomnica

  • Event date

    May 11, 2011

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article