Detection of secondary electrons by scintillation detector at VP SEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU94022" target="_blank" >RIV/00216305:26220/11:PU94022 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/11:00368932
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Detection of secondary electrons by scintillation detector at VP SEM
Original language description
This article deals with scintillation secondary electron detrector for variable pressure scanning electron microscope
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP102%2F10%2F1410" target="_blank" >GAP102/10/1410: The study of the influence of magnetic and electric fields for amplification of secondary electron signals detected by a novel detector in VP-SEM.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
MICROSCOPY AND MICROANALYSIS
ISSN
1431-9276
e-ISSN
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Volume of the periodical
2
Issue of the periodical within the volume
17
Country of publishing house
US - UNITED STATES
Number of pages
2
Pages from-to
922-923
UT code for WoS article
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EID of the result in the Scopus database
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