Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95459" target="_blank" >RIV/00216305:26220/11:PU95459 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods
Original language description
We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD camera has been used for mapping the surface photon emission from localized defects. The operation point of the samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a combination of optical investigations and electricalnoise measurement in the time and spectral domain, we reveal a direct correlation between noise and photon emission. The results for several defect spots are presented in detail.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluctuation processes in PN junctions of solar cells</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Proceedings of SPIE
ISSN
0277-786X
e-ISSN
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Volume of the periodical
8036
Issue of the periodical within the volume
8306
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
"1I1"-"1I6"
UT code for WoS article
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EID of the result in the Scopus database
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