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Analysis of photon emision from silicon solar cells and correlation with microplasma noise

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95464" target="_blank" >RIV/00216305:26220/11:PU95464 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Analysis of photon emision from silicon solar cells and correlation with microplasma noise

  • Original language description

    Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to getinformation about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. Theresults related to several defect spots are presented in detail in this paper.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluctuation processes in PN junctions of solar cells</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2011

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    proceedings of the 17th conference student eeict 2011 vol. 3

  • ISBN

    978-80-214-4273-3

  • ISSN

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    417-421

  • Publisher name

    Novpress

  • Place of publication

    Brno

  • Event location

    Brno

  • Event date

    Apr 28, 2011

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article