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COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU99174" target="_blank" >RIV/00216305:26220/12:PU99174 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS

  • Original language description

    This paper discusses the issue of silicon solar cells localized defects from metrological and physical points of view. Structure imperfections represent the real problem because of solar cells long-term degradation and conversion efficiency decreasing. To this aim we pay our attention to research relating to the defect light emission and correlation with rectangular microplasma fluctuation. A sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode, and different electric field intensity was applied. We managed to get interesting information using a combination of optical investigation and electrical noise measurement in time and spectral domain. It will be revealedthat a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk)

  • ISSN

    1804-3119

  • e-ISSN

  • Volume of the periodical

    10

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    6

  • Pages from-to

    6-11

  • UT code for WoS article

  • EID of the result in the Scopus database