Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95460" target="_blank" >RIV/00216305:26220/11:PU95460 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods
Original language description
This paper, for the first time, investigates localized defects of silicon solar cells. These imperfections represent real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this issue, this paper does systematic research about optical investigation of local defect spots and correlation with rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting information using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results
Czech name
—
Czech description
—
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluctuation processes in PN junctions of solar cells</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
ElectroScope - http://www.electroscope.zcu.cz
ISSN
1802-4564
e-ISSN
—
Volume of the periodical
2011
Issue of the periodical within the volume
2
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
6
Pages from-to
38-43
UT code for WoS article
—
EID of the result in the Scopus database
—