Isolation and optoelectronic characterization of Si solar cells microstructure defects

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F18%3APU130447" target="_blank" >RIV/00216305:26220/18:PU130447 - isvavai.cz</a>

Result on the web

<a href="http://iopscience.iop.org/article/10.1088/1742-6596/1124/4/041009" target="_blank" >http://iopscience.iop.org/article/10.1088/1742-6596/1124/4/041009</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1742-6596/1124/4/041009" target="_blank" >10.1088/1742-6596/1124/4/041009</a>

Result language

angličtina

Original language name

Isolation and optoelectronic characterization of Si solar cells microstructure defects

Original language description

This research article presents results of silicon solar cell defects optoelectronic characterization based on several experimental methods. These microstructure defects have their origin mainly in the production process, but also can be caused by mechanical stress. However, some defect related spots emit light when the cell is reverse biased. Therefore, electroluminescence (EL) method is used for macroscopic localization and scanning near-field optical microscopy (SNOM) combined with photomultiplier tube in order to scan topography of defective area in microscale. Moreover, elemental analysis of the defects related spots provided by energy-dispersive X-ray spectroscopy (EDX) is presented as well. Besides that, focused ion beam (FIB) was used to isolate the defective spots by 2 µm wide and 2 µm deep barrier. Isolation pattern around the defect is avoiding leakage current flow through it. Since leakage current does not flow through defect, solar cell parameters in reverse conditions are improved.

Czech name

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Czech description

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Type

J_SC - Article in a specialist periodical, which is included in the SCOPUS database

CEP classification

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OECD FORD branch

20201 - Electrical and electronic engineering

Project

—

Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Physics: Conference Series

ISSN

1742-6588

e-ISSN

1742-6596

Volume of the periodical

1124

Issue of the periodical within the volume

4

Country of publishing house

GB - UNITED KINGDOM

Number of pages

6

Pages from-to

1-6

UT code for WoS article

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EID of the result in the Scopus database

2-s2.0-85060975663