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Structural and optical properties of Gd implanted GaN with various crystallographic orientations

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F26722445%3A_____%2F17%3AN0000028" target="_blank" >RIV/26722445:_____/17:N0000028 - isvavai.cz</a>

  • Alternative codes found

    RIV/67985882:_____/17:00479677 RIV/61389005:_____/17:00479677 RIV/60461373:22310/17:43913373 RIV/44555601:13440/17:43892900

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.tsf.2017.07.036" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2017.07.036</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.tsf.2017.07.036" target="_blank" >10.1016/j.tsf.2017.07.036</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Structural and optical properties of Gd implanted GaN with various crystallographic orientations

  • Original language description

    Structure, morphology, and optical properties of Gd implanted GaN epitaxial layers were studied for (0001), (11-20), and (11-22) orientations. The GaN layers grown by MOVPE on sapphire were subsequently implanted with 200 keV Gd+ ions using fluences of 5 x 10(15) and 5 x 10(16) cm(-2). Dopant depth profiling was accomplished by Rutherford Back-Scattering spectrometry (RBS). Structural and optical changes during subsequent annealing were characterized by RBS, Raman spectroscopy, and photoluminescence measurements. Post-implantation annealing induced a structural reorganization of GaN structure in the buried layer depending on the introduced disorder level, i.e. depending on the implantation fluence and on crystallographic orientation. The defect density depth distribution was evaluated by RBS. The surface morphology and optical properties depend on particular crystallographic orientation.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20501 - Materials engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Thin Solid Films

  • ISSN

    0040-6090

  • e-ISSN

  • Volume of the periodical

    638

  • Issue of the periodical within the volume

    September

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    10

  • Pages from-to

    63-72

  • UT code for WoS article

    000411775900009

  • EID of the result in the Scopus database

    2-s2.0-85025099941