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RBS and XPS Study of TiOx Layers Prepared by PVD Technique

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24210%2F03%3A24210122" target="_blank" >RIV/46747885:24210/03:24210122 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    RBS and XPS Study of TiOx Layers Prepared by PVD Technique

  • Original language description

    The PVD-coatings were prepared using Sulzer Innotec?s closed magnetic field unbalanced magnetron sputtering facility. The deposition parameters the bias and oxygen flow rate were changed. The samples prepared were analysed by RBS (Rutherford Backscatterig Spectrometry) to determine the Ti/O ratios and the thicknesses of the coatings and by ERDA (Elastic Recoil Detection Analysis) to investigate the hydrogen content in the surface layer. XPS (X-ray induced Photoelectron Spectroscopy) was used to characteise the near surface composition and chemical bonding. Measurements of mechanical properties (hardness and thickness) were performed. We concluded from RBS analysis that Ti content is enhanced by the increased bias and the decreased oxygen flow rate. Webserved the increasing hardness according to the higher Ti content in the layers prepared. We found out that the contaminated surface layer exist in which the hydrogen and carbon are incorporated.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BL - Plasma physics and discharge through gases

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Surface and Interface Analysis

  • ISSN

    0142-2421

  • e-ISSN

  • Volume of the periodical

    Neuveden

  • Issue of the periodical within the volume

    2003

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    8

  • Pages from-to

    139-147

  • UT code for WoS article

  • EID of the result in the Scopus database