Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata

Result code in IS VaVaI
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Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Pseudorandom,Weighted Random and Pseudoexhaustive Test Patterns Generated in Universal Cellular Automata
Original language description
The paper presents a design method for Built-In Self Test (BIST) that uses a cellular automaton (CA) for test pattern generation. We have extensively studied the quality of generated patterns and we have found several interesting properties of them. Thefirst possibility how to use the CA is to generate pseudoexhaustive test sets as the CA can generate code words of codes with higher minimal code distance of the dual code. There is no need of reseeding the CA in order to generate all the code wordsThe proposed CA can also generate weighted random patterns with different global weights which can be used instead of linear feedback shift register (LFSR) pseudorandom sequences, the fault coverage is higher. It can also be used as deterministic pattern compactor in mixed mode testing. Several experiments were done with ISCAS 85 and 89 benchmark circuits. We compared the quality of the generated test patterns with the quality of the patterns generated in an LFSR .
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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