Weighted Random Patterns for BIST Generated in Cellular Automata
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F46747885%3A24220%2F99%3A00000046" target="_blank" >RIV/46747885:24220/99:00000046 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Weighted Random Patterns for BIST Generated in Cellular Automata
Original language description
The paper presents a design method of cellular automaton. The proposed CA can generate weighted random patterns which can be used instead of linear feedback shift register (LFSR) sequences, the fault coverage is higher. We compared the quality of the generated test patterns with the quality of the patterns generated in an LFSR and with the quality of modified test patterns with several different global test pattern weights. The proposed CA can be advantageously used in BIST.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of 5.th International On-Line Testing Workshop
ISBN
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ISSN
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e-ISSN
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Number of pages
5
Pages from-to
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Publisher name
IEEE
Place of publication
Řecko
Event location
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Event date
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Type of event by nationality
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UT code for WoS article
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