Yield and Defect Level Prediction of Designed Printed Circuit Board
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F11%3A43914916" target="_blank" >RIV/49777513:23220/11:43914916 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/ISSE.2011.6053570" target="_blank" >http://dx.doi.org/10.1109/ISSE.2011.6053570</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/ISSE.2011.6053570" target="_blank" >10.1109/ISSE.2011.6053570</a>
Alternative languages
Result language
angličtina
Original language name
Yield and Defect Level Prediction of Designed Printed Circuit Board
Original language description
In this paper a new prediction tool is presented, which can provide both yield and defect level predictions. The tool, which is based on DPMO (defects per million opportunities) metric, is intended for newly designed printed circuit board assemblies. Itis programmed in Visual Basic for Application (VBA) and it can be operated in MS Excel environment. Yield prediction is based on so called the yield-DPMO model that is an extension of the yield prediction model, which was created in my dissertation and published in the paper [1]. The yield-DPMO model provides more outputs for quality planners then yield prediction model. The defect level prediction is based on the so called the "defect level-DPMO" model, which works on the basis of complexity based estimate, where from inputs data are determined the defect spectrums and tests coverage. The advantage of DPMO is the fact that it is fully comparable metric and it is not associated only with the certain manufacturing line. Thanks to this to
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JS - Reliability and quality management, industrial testing
OECD FORD branch
—
Result continuities
Project
—
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
34th International Spring Seminar on Electronics Technology
ISBN
978-1-4577-2112-0
ISSN
2161-2528
e-ISSN
—
Number of pages
6
Pages from-to
162-167
Publisher name
IEEE
Place of publication
Piscataway
Event location
Tatranská Lomnica
Event date
May 11, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—