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Influence of Intermetallic Compounds Growth on Properties of Lead-free Solder Joints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F12%3A43925000" target="_blank" >RIV/49777513:23220/12:43925000 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/ISSE.2012.6273075" target="_blank" >http://dx.doi.org/10.1109/ISSE.2012.6273075</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2012.6273075" target="_blank" >10.1109/ISSE.2012.6273075</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Influence of Intermetallic Compounds Growth on Properties of Lead-free Solder Joints

  • Original language description

    This article deals with the growth of intermetallic compounds (IMCs) in solder joints and influence of these IMCs on properties of soldered joints. The test specimens of printed circuit boards (PCBs) with different surface finishes were made for this experiment. Tin_G (galvanic tin), Tin_C (immersion tin), Cu (pure copper), OSP (organic solderability preservative) and ENIG (electroless nickel immersion gold) surface finishes were chosen. The soldered joints were created on the test specimens by reflow soldering process. The surface mount solder joints of LCCC resistor of size 1206 were studied. Two lead-free solder paste and one tin-lead solder paste were chosen for research of IMCs and their influence on properties of soldered joints. The test specimens were exposed to elevated aging for research of IMCs growth in solder joint. The specimens were thermal stressed in hot air oven at the temperature of 150°C for a periods of 0, 1, 2, 4, 8, and 16 days. The shear test was used for resear

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED2.1.00%2F03.0094" target="_blank" >ED2.1.00/03.0094: Regional Innovation Centre for Electrical Engineering (RICE)</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2012

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    35 th International Spring Seminar on Electronics Technology - Power Electronics

  • ISBN

    978-1-4673-2240-9

  • ISSN

    2161-2528

  • e-ISSN

  • Number of pages

    5

  • Pages from-to

    213-217

  • Publisher name

    Vienna University of Technology, Austria

  • Place of publication

    Vienna

  • Event location

    Bad Aussee, Austria

  • Event date

    May 9, 2012

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article