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Properties of thick printed copper films on aluminum nitride substrates

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23220%2F21%3A43962005" target="_blank" >RIV/49777513:23220/21:43962005 - isvavai.cz</a>

  • Result on the web

    <a href="https://ieeexplore.ieee.org/document/9467591" target="_blank" >https://ieeexplore.ieee.org/document/9467591</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE51996.2021.9467591" target="_blank" >10.1109/ISSE51996.2021.9467591</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Properties of thick printed copper films on aluminum nitride substrates

  • Original language description

    This paper is focused on the properties of Thi ck Printed Copper (TPC) films printed on aluminum nitride (AlN) substrates. TPC technology is based on thick film technology and it is predominantly intended for power substrate manufacturing. TPC films can be also printed on ceramic substrates with high thermal conductivity such as AlN and this combination enables the realization of high power substrates. The electrical and mechanical parameters and structure of TPC films on AlN substrates are described in this paper.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2021 44th International Spring Seminar on Electronics Technology : /proceedings/

  • ISBN

    978-1-66541-477-7

  • ISSN

  • e-ISSN

    2161-2536

  • Number of pages

    5

  • Pages from-to

    1-5

  • Publisher name

    IEEE

  • Place of publication

    Piscaway

  • Event location

    web-basec Conference, Bautzen, Germany

  • Event date

    May 5, 2021

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000853459100037