Analysis of optical properties of carbon films by spectroscopic ellipsometry 20-1163

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23520%2F20%3A43959074" target="_blank" >RIV/49777513:23520/20:43959074 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Analysis of optical properties of carbon films by spectroscopic ellipsometry 20-1163
Original language description
The aim of the project was analysis of optical properties of 6 carbon films and metallic interlayers which the films were deposited on. The project is related to the activities of the industrial partner in the field of fuel cells. The properties were analyzed in the visible as well as in the infrared. Measurements were performed by spectroscopic ellipsometry (change of light polarization after its reflection from a material). For each analyzed film, these raw data were used to obtain the dependencies of its refractive index and extinction coefficient on the wavelength. The new results were compared with those obtained previously (5/2020) and (in the case of metallic interlayers) with the literature.
Czech name
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Czech description
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Publication year
2020
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

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