Analysis of optical properties of a carbon films by spectroscopic ellipsometry - 20-1591

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23520%2F20%3A43961171" target="_blank" >RIV/49777513:23520/20:43961171 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Analysis of optical properties of a carbon films by spectroscopic ellipsometry - 20-1591
Original language description
The aim of the project was analysis of optical properties of 3 carbon films and the metallic interlayer which the films were deposited on. The project is related to the activities of the industrial partner in the field of fuel cells. The properties were analyzed in the visible as well as in the infrared. Measurements were performed by spectroscopic ellipsometry (change of light polarization after its reflection from a material). For each analyzed film, these raw data were used to obtain the dependencies of its refractive index and extinction coefficient on the wavelength. Additional complementary measurements were performed by spectrophotometry and atomic force microscopy, and the results were used to explain and confirm each other.
Czech name
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Czech description
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Publication year
2020
Confidentiality
C - Předmět řešení projektu podléhá obchodnímu tajemství (§ 504 Občanského zákoníku), ale název projektu, cíle projektu a u ukončeného nebo zastaveného projektu zhodnocení výsledku řešení projektu (údaje P03, P04, P15, P19, P29, PN8) dodané do CEP, jsou upraveny tak, aby byly zveřejnitelné.

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