Determination of optical parameters of thin films from transmittance spectra

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F11%3A43900877" target="_blank" >RIV/49777513:23640/11:43900877 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Determination of optical parameters of thin films from transmittance spectra
Original language description
Method introduced in this paper was developed to analyse TCO films (Transparent Conductive Oxides), particularly samples of scandium doped zinc oxide (ZnO:Sc) thin films, which is a promising material for application in thin film photovoltaic cells and various optoelectronic devices. Samples were prepared by the rf magnetron sputtering using a BOC Edwards TF 600 electron beam and sputtering system. Transmittances spectra were measured by using UV/Vis double-beam spectrophotometer SPECORD 210 in its maximal wave range of 190 ? 1100 nm.
Czech name
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Czech description
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Project
<a href="/en/project/ED2.1.00%2F03.0088" target="_blank" >ED2.1.00/03.0088: Centre of the New Technologies and Materials</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th International Conference on Applied Physics of Condensed Matter
ISBN
978-80-554-0386-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
110-113
Publisher name
University of Žilina
Place of publication
Žilina
Event location
Spa Nový Smokovec, High Tatras, Slovakia
Event date
Jun 22, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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