Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F12%3A43916613" target="_blank" >RIV/49777513:23640/12:43916613 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies
Original language description
Microcrystalline silicon is very important material for silicon based thin-film solar cells. X-ray diffraction, Raman and FTIR spectroscopies are powerful experimental methods, which can answer the questions dealing with the crystal structure and hydrogen distribution in the material analyzed. On the other hand, optical band-gaps, spectral refractive indices and absorption properties of the films can be carried out from the UV-Vis spectroscopy.
Czech name
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Czech description
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Project
<a href="/en/project/ED2.1.00%2F03.0088" target="_blank" >ED2.1.00/03.0088: Centre of the New Technologies and Materials</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Progress in Applied Surface, Inteface and Thin Film Science 2012, SURFINT -SREN III
ISBN
978-80-223-3212-5
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
73-76
Publisher name
Univerzita Komenského Bratislava
Place of publication
Bratislava
Event location
Florence, Italie
Event date
May 14, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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