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SYNERGY EFFECT OF XRD, RAMAN, FTIR, UVVIS AND TEM ANALYSES IN mýc-Si:H AND nc-Si MICROSTRUCTURE DETERMINATION

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F49777513%3A23640%2F14%3A43924243" target="_blank" >RIV/49777513:23640/14:43924243 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    SYNERGY EFFECT OF XRD, RAMAN, FTIR, UVVIS AND TEM ANALYSES IN mýc-Si:H AND nc-Si MICROSTRUCTURE DETERMINATION

  • Original language description

    Tandem solar cells based on a-Si:H/mc-Si:H double- or triple-junction technology are very important for silicon thin film approach in order to enhance the efficiency of the cells especially convenient for the residential systems. Because for such systemsthe mc-Si:H and nc-Si materials have substantial importance, it is necessary to create them as good as possible. In order to obtain the required information about the structural and optical properties of the mc-Si:H and nc-Si films, X-ray diffraction, TEM, Raman and FTIR spectroscopies and UVVis spectrophotometry have to be used. In this study, a-Si:H, mc-Si:H films 300-350 nm in thickness and SiO2/a-Si:H multi-layers 600-650 nm in thickness were deposited by PECVD on Corning glass and crystalline silicon substrates to find out the influence of silane dilution with hydrogen in mc-Si:H films and a-Si:H sub-layer thickness in SiO2/a-Si multi-layered films on the micro-structural and optical properties of the films. The study was focused

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/ED2.1.00%2F03.0088" target="_blank" >ED2.1.00/03.0088: Centre of the New Technologies and Materials</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings ot the international Conference 29th European Photovoltaic Solar Energy Conference and Exhibition

  • ISBN

    3-936338-34-5

  • ISSN

    2196-0992

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    1955-1958

  • Publisher name

    WIP

  • Place of publication

    Mnichov

  • Event location

    Amsterdam, Holandsko

  • Event date

    Sep 22, 2014

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article