Nanoimaging of Orientational Defects in Semiconducting Organic Films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60076658%3A12310%2F21%3A43903203" target="_blank" >RIV/60076658:12310/21:43903203 - isvavai.cz</a>
Alternative codes found
RIV/00216224:14310/21:00119566
Result on the web
<a href="https://pubs.acs.org/doi/full/10.1021/acs.jpcc.1c00059" target="_blank" >https://pubs.acs.org/doi/full/10.1021/acs.jpcc.1c00059</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1021/acs.jpcc.1c00059" target="_blank" >10.1021/acs.jpcc.1c00059</a>
Alternative languages
Result language
angličtina
Original language name
Nanoimaging of Orientational Defects in Semiconducting Organic Films
Original language description
The development of defect analysis for inorganic semiconductors in the past century paved the way for the success story of today's electronics. By analogy, defect analysis plays a critical role in developing and improving devices based on organic molecular semiconductors. However, because of weak molecular interactions, absent in inorganic semiconductors, device-relevant thin organic films are susceptible to the formation of defects in the molecular orientation, which in turn have a profound impact on the performance in the optoelectronic applications. To address this problem, we broaden the applicability of scattering-type scanning near-field optical microscopy (s-SNOM) and utilize the light-induced anisotropic response of vibrational modes to reveal the defects in molecular orientation. We show that in the case of molecular islands with steep crystal facets only the scattered s-SNOM optical amplitude can be exploited to describe the molecular arrangement reliably, while the phase-based analysis leads to artifacts. The presented s-SNOM analysis of molecular defects can be universally applied to diverse topographies, even at the nanoscale.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10403 - Physical chemistry
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Physical Chemistry C
ISSN
1932-7447
e-ISSN
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Volume of the periodical
125
Issue of the periodical within the volume
17
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
9229-9235
UT code for WoS article
000648873500031
EID of the result in the Scopus database
2-s2.0-85106413466