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Nanoimaging of Orientational Defects in Semiconducting Organic Films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60076658%3A12310%2F21%3A43903203" target="_blank" >RIV/60076658:12310/21:43903203 - isvavai.cz</a>

  • Alternative codes found

    RIV/00216224:14310/21:00119566

  • Result on the web

    <a href="https://pubs.acs.org/doi/full/10.1021/acs.jpcc.1c00059" target="_blank" >https://pubs.acs.org/doi/full/10.1021/acs.jpcc.1c00059</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1021/acs.jpcc.1c00059" target="_blank" >10.1021/acs.jpcc.1c00059</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Nanoimaging of Orientational Defects in Semiconducting Organic Films

  • Original language description

    The development of defect analysis for inorganic semiconductors in the past century paved the way for the success story of today&apos;s electronics. By analogy, defect analysis plays a critical role in developing and improving devices based on organic molecular semiconductors. However, because of weak molecular interactions, absent in inorganic semiconductors, device-relevant thin organic films are susceptible to the formation of defects in the molecular orientation, which in turn have a profound impact on the performance in the optoelectronic applications. To address this problem, we broaden the applicability of scattering-type scanning near-field optical microscopy (s-SNOM) and utilize the light-induced anisotropic response of vibrational modes to reveal the defects in molecular orientation. We show that in the case of molecular islands with steep crystal facets only the scattered s-SNOM optical amplitude can be exploited to describe the molecular arrangement reliably, while the phase-based analysis leads to artifacts. The presented s-SNOM analysis of molecular defects can be universally applied to diverse topographies, even at the nanoscale.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10403 - Physical chemistry

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Physical Chemistry C

  • ISSN

    1932-7447

  • e-ISSN

  • Volume of the periodical

    125

  • Issue of the periodical within the volume

    17

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    7

  • Pages from-to

    9229-9235

  • UT code for WoS article

    000648873500031

  • EID of the result in the Scopus database

    2-s2.0-85106413466