Differential Thickness Layer Resistance Measurement method for measurements of contact resistance of organic semiconductor thin films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F60461373%3A22310%2F15%3A43900016" target="_blank" >RIV/60461373:22310/15:43900016 - isvavai.cz</a>
Alternative codes found
RIV/60461373:22340/15:43900016
Result on the web
<a href="http://www.sciencedirect.com/science/article/pii/S0263224115003607" target="_blank" >http://www.sciencedirect.com/science/article/pii/S0263224115003607</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.measurement.2015.07.025" target="_blank" >10.1016/j.measurement.2015.07.025</a>

Result language
angličtina
Original language name
Differential Thickness Layer Resistance Measurement method for measurements of contact resistance of organic semiconductor thin films
Original language description
The objective, basic theory and application of a new DTLRM (Differential Thickness Layer Resistance Measurement) method of contact resistance R-c (resistance of interface) and contact resistivity measurements are described. The method was developed for ultrathin films of high-ohmic organic semiconductors. The method is based on measurements of total resistance R-T,R-1, R-T,R-2 between two opposite planar contacts on two samples of differing thickness L-1, L-2 prepared from the same organic semiconductor. The important requirements are that both the opposite contacts are ohmic, that linear dimensions of the contacts are much larger than the film thickness, and that the actual measured data are consistent in the sense of condition 1 < R-T,R-2/R-T,R-1 < L-2/L-1. The DTLRM method was verified on zinc phthalocyanine samples with Au and Pt contacts. If the basic assumptions are fulfilled, the DTLRM method can be applied to a broad range of high-ohmic thin films.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Project
<a href="/en/project/GA14-10279S" target="_blank" >GA14-10279S: Advanced materials for photovoltaics: substituted phthalocyanine organocomplexes</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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