Cathodoluminescence study of electron beam formed defects in polysilanes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61389013%3A_____%2F09%3A00335270" target="_blank" >RIV/61389013:_____/09:00335270 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/09:00335270
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Cathodoluminescence study of electron beam formed defects in polysilanes
Original language description
In materials science and semiconductor engineering, cathodoluminescence (CL) is a very efficient tool for the study of electronic substance structure and application possibilities. In spite of this, CL is only very rarely used for investigation of polymers. Recently Wellman et al introduced CL as an important tool for the investigation of materials for organic electroluminescence devices. It is evident that CL may become a strong tool for the investigation of polymer light emission possibilities as wellas for investigation of triplet harvester organic solar cells. Our interest has been focused on the group of polysilanes (often also called polysilylanes), especially on poly[methyl(phenyl)silane] (PMPSi), having linear backbone of linked silicon atoms.Cathodoluminescence study of electron beam formed defects in PMPSi is presented in this paper.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/IAA100100622" target="_blank" >IAA100100622: CONJUGATED SILICON ? BASED POLYMER RESISTS FOR NANOTECHNOLOGIES</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy
ISBN
978-3-85125-062-6
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Verlag der Technischen Universität
Place of publication
Graz
Event location
Graz
Event date
Aug 30, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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