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In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27640%2F17%3A10236967" target="_blank" >RIV/61989100:27640/17:10236967 - isvavai.cz</a>

  • Alternative codes found

    RIV/61989100:27740/17:10236967

  • Result on the web

    <a href="https://ac.els-cdn.com/S0169433216329312/1-s2.0-S0169433216329312-main.pdf?_tid=d1aa9fc0-fb8e-11e7-b243-00000aacb35f&acdnat=1516197828_27d891081ea7385821a0b24a55893424" target="_blank" >https://ac.els-cdn.com/S0169433216329312/1-s2.0-S0169433216329312-main.pdf?_tid=d1aa9fc0-fb8e-11e7-b243-00000aacb35f&acdnat=1516197828_27d891081ea7385821a0b24a55893424</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.apsusc.2016.12.199" target="_blank" >10.1016/j.apsusc.2016.12.199</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells

  • Original language description

    In-situ Mueller matrix spectroscopic ellipsometry was applied for monitoring the silicon nanowire growth by plasma-enhanced vapor-liquid-solid method. The technique is proposed as a real-time, non-destructive, and non-invasive characterization of the deposition process in a plasma-enhanced chemical vapor deposition reactor. The data have been taken by spectrally resolved Mueller matrix ellipsometer every 1 min during the 8-10 min long nanowire growth process. We have developed an easy-to-apply optical model to fit the experimental data, which enables to study the evolution of the parameters of the structure during initial stages of the growth. The first results provide information about the effective deposition rate determined from the linear increase of the deposited silicon volume with the deposition time.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10306 - Optics (including laser optics and quantum optics)

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Surface Science

  • ISSN

    0169-4332

  • e-ISSN

  • Volume of the periodical

    421

  • Issue of the periodical within the volume

    1 November 2017

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    7

  • Pages from-to

    667-673

  • UT code for WoS article

    000408756700063

  • EID of the result in the Scopus database

    2-s2.0-85012022755