In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F61989100%3A27640%2F17%3A10236967" target="_blank" >RIV/61989100:27640/17:10236967 - isvavai.cz</a>
Alternative codes found
RIV/61989100:27740/17:10236967
Result on the web
<a href="https://ac.els-cdn.com/S0169433216329312/1-s2.0-S0169433216329312-main.pdf?_tid=d1aa9fc0-fb8e-11e7-b243-00000aacb35f&acdnat=1516197828_27d891081ea7385821a0b24a55893424" target="_blank" >https://ac.els-cdn.com/S0169433216329312/1-s2.0-S0169433216329312-main.pdf?_tid=d1aa9fc0-fb8e-11e7-b243-00000aacb35f&acdnat=1516197828_27d891081ea7385821a0b24a55893424</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.apsusc.2016.12.199" target="_blank" >10.1016/j.apsusc.2016.12.199</a>
Alternative languages
Result language
angličtina
Original language name
In-situ Mueller matrix ellipsometry of silicon nanowires grown by plasma-enhanced vapor-liquid-solid method for radial junction solar cells
Original language description
In-situ Mueller matrix spectroscopic ellipsometry was applied for monitoring the silicon nanowire growth by plasma-enhanced vapor-liquid-solid method. The technique is proposed as a real-time, non-destructive, and non-invasive characterization of the deposition process in a plasma-enhanced chemical vapor deposition reactor. The data have been taken by spectrally resolved Mueller matrix ellipsometer every 1 min during the 8-10 min long nanowire growth process. We have developed an easy-to-apply optical model to fit the experimental data, which enables to study the evolution of the parameters of the structure during initial stages of the growth. The first results provide information about the effective deposition rate determined from the linear increase of the deposited silicon volume with the deposition time.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10306 - Optics (including laser optics and quantum optics)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Applied Surface Science
ISSN
0169-4332
e-ISSN
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Volume of the periodical
421
Issue of the periodical within the volume
1 November 2017
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
7
Pages from-to
667-673
UT code for WoS article
000408756700063
EID of the result in the Scopus database
2-s2.0-85012022755