Surface roughness and resistivity of thin films.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F02%3A13020040" target="_blank" >RIV/67985882:_____/02:13020040 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Surface roughness and resistivity of thin films.
Original language description
Surface finish of alumina thin film substrates was measured with stylus profilometer. A connection between the obtained values of Ra and the thin film resistance was studied. No correlation can be found owing to big stylus radius and computation method used in profilometer.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
<a href="/en/project/KSK1010104" target="_blank" >KSK1010104: Condensed matter physics and materials science</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Applied Electronics 2002.
ISBN
80-7082-881-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
63-66
Publisher name
University of West Bohemia
Place of publication
Pilsen
Event location
Pilsen [CZ]
Event date
Sep 11, 2002
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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