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Surface roughness and resistivity of thin films.

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F67985882%3A_____%2F02%3A13020040" target="_blank" >RIV/67985882:_____/02:13020040 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Surface roughness and resistivity of thin films.

  • Original language description

    Surface finish of alumina thin film substrates was measured with stylus profilometer. A connection between the obtained values of Ra and the thin film resistance was studied. No correlation can be found owing to big stylus radius and computation method used in profilometer.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/KSK1010104" target="_blank" >KSK1010104: Condensed matter physics and materials science</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2002

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Applied Electronics 2002.

  • ISBN

    80-7082-881-1

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    63-66

  • Publisher name

    University of West Bohemia

  • Place of publication

    Pilsen

  • Event location

    Pilsen [CZ]

  • Event date

    Sep 11, 2002

  • Type of event by nationality

    EUR - Evropská akce

  • UT code for WoS article