Advances in scanning electron microscopy.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F02%3A12020106" target="_blank" >RIV/68081731:_____/02:12020106 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Advances in scanning electron microscopy.
Original language description
The monograph defines a configuration, construction and electron optical parameters of a standard scanning electron microscope and it defines and analyses new principals and approaches towards this standard. All aspects of the device are dealt with including the detection system, mechanization of the construction, vacuum and control electronics. The attention is devoted to new trends, which are: microscopy at higher pressure, microscopy byvery slow electrons and multi-channel signal detection.
Czech name
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Czech description
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Classification
Type
C - Chapter in a specialist book
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA202%2F99%2F0008" target="_blank" >GA202/99/0008: Further development of the non-charging scanning electron microscopy of non-conductive specimens</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Book/collection name
Advances in imaging and electron physics.
ISBN
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Number of pages of the result
46
Pages from-to
327-373
Number of pages of the book
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Publisher name
Elsevier science
Place of publication
New York
UT code for WoS chapter
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