Contrast Mechanisms in the Scanning Low Energy Electron Microscopy.

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F03%3A12030024" target="_blank" >RIV/68081731:_____/03:12030024 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Contrast Mechanisms in the Scanning Low Energy Electron Microscopy.

Original language description

The SEM instruments, marketed at the present time, cover the range of impact energies of primary electrons down to 1 keV. Systems with compound objective lenses, containing a retarding field element, extend this range down to about 200 eV and the cathodelens (CL) equipped devices allow using arbitrarily low impact energy at acceptable resolution [1]. Consequently, the electron energy becomes a mere parameter of the SEM image and all contrast mechanisms, excited by electron impact, appear as equally available. Similarly, the strict distinguishing between kinds of information mediated by seconary (SE) and backscattered (BSE) electrons, respectively, is less relevant with novel detector principles employing acceleration of emitted electrons and conversion of accelerated signal species to slow SE. A CL equipped SEM detects SE and BSE together so that both should be always considered with any particular family of contrasts.

Czech name

—

Czech description

—

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

—

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2003

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Microscopy and Microanalysis

ISSN

1431-9276

e-ISSN

—

Volume of the periodical

9

Issue of the periodical within the volume

Sup. 3

Country of publishing house

US - UNITED STATES

Number of pages

2

Pages from-to

120-121

UT code for WoS article

—

EID of the result in the Scopus database

—