Advances in Low Energy Scanning Electron Microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F10%3A00352422" target="_blank" >RIV/68081731:_____/10:00352422 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Advances in Low Energy Scanning Electron Microscopy
Original language description
Among traditional methods of the electron microscopy (EM) the transmission EM operates at highest energies of electrons and the sample used to be immersed in strong magnetic field. The emission EM has its sample emitting very slow electrons in strong electric field of the cathode lens (CL). The conventional scanning EM (SEM) worked in the medium energy range with the sample in a field free space. Immersion of the SEM sample into magnetic field (and correction of aberrations) improved the resolution up to observation of single atoms. When transferring the CL principle into the SEM we preserve a small primary spot down to lowest energies with the electric field strength as a factor limiting the resolution.
Czech name
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Czech description
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Project
<a href="/en/project/IAA100650902" target="_blank" >IAA100650902: Scanning transmission electron microscopy with very slow electrons</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th IFSM International Microscopy Congress
ISBN
978-85-63273-06-2
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
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Publisher name
Sociedade Brasileira de Microscopia e Microanilise
Place of publication
Rio de Janeiro
Event location
Rio de Janeiro
Event date
Sep 19, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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