Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F11%3A00368930" target="_blank" >RIV/68081731:_____/11:00368930 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1017/S1431927611005472" target="_blank" >http://dx.doi.org/10.1017/S1431927611005472</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1017/S1431927611005472" target="_blank" >10.1017/S1431927611005472</a>
Alternative languages
Result language
angličtina
Original language name
Simulation of Energy Selective signal Amplification in Gas Environment of Variable Pressure SEM
Original language description
High pressure of gas mostly water vapour, with pressure range from 0.1 Pa to 80 Pa in the first differentially pumped chamber and 10 Pa to over 2000 Pa in the specimen chamber is used in variable pressure scanning electron microscopes (VP-SEM) such as our experimental AQUASEM II equipped with a combined YAG-BSE and ionization detector of SE. The gas environment causes unwanted primary electron beam diffusion, but it also supports gas ionization cascade amplification of the signal of secondary electrons(SE), accelerated by the applied field of detection electrode of the ionisation detector.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP102%2F10%2F1410" target="_blank" >GAP102/10/1410: The study of the influence of magnetic and electric fields for amplification of secondary electron signals detected by a novel detector in VP-SEM.</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microscopy and Microanalysis
ISSN
1431-9276
e-ISSN
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Volume of the periodical
17
Issue of the periodical within the volume
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Country of publishing house
US - UNITED STATES
Number of pages
2
Pages from-to
920-921
UT code for WoS article
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EID of the result in the Scopus database
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