Backscattered electrons in examination of materials
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00379918" target="_blank" >RIV/68081731:_____/12:00379918 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Backscattered electrons in examination of materials
Original language description
Methods employing the emission of backscattered electrons from surfaces of materials in determination of their chemical composition and crystallinic and electronic structures are summarized.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GAP108%2F11%2F2270" target="_blank" >GAP108/11/2270: Mapping of the local crystallinic structure by backscattered electrons</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Coneference Proceedings APMC-10, ICONN 2012 and ACMM-22
ISBN
978-1-74052-245-8
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
"940:1"-"2"
Publisher name
EECW Pty Ltd
Place of publication
Wembley
Event location
Perth
Event date
Feb 5, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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