Scanning Electron Microscopy with biased samples
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F14%3A00434071" target="_blank" >RIV/68081731:_____/14:00434071 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scanning Electron Microscopy with biased samples
Original language description
The arrangement of the scanning electron microscope with the sample biased to a high negative potential is discussed from the point of view of detection of signal electrons both in reflected and transmitted modes.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LO1212" target="_blank" >LO1212: ALISI - Centre of advanced diagnostic methods and technologies</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
EM2014. 15th International Conference on Electron Microscopy
ISBN
978-83-63663-48-3
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
76-77
Publisher name
Wydawnictwo Naukove Akapit
Place of publication
Kraków
Event location
Kraków
Event date
Sep 15, 2014
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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