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Measurements of current density distribution in shaped e-beam writers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F16%3A00454665" target="_blank" >RIV/68081731:_____/16:00454665 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.mee.2015.09.013" target="_blank" >http://dx.doi.org/10.1016/j.mee.2015.09.013</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.mee.2015.09.013" target="_blank" >10.1016/j.mee.2015.09.013</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Measurements of current density distribution in shaped e-beam writers

  • Original language description

    In this paper, we present four measurement methods for the two-dimensional mapping of the current density distribution in variable-shaped e-beam writers. All the methods use only the native equipment of the e-beam writer which provides the advantage of relatively easy implementation. The first and second measurement methods are based on the knife-edge technique in which the e-beam is scanned in two directions across a Faraday cup opening and across shaping shutters of the forming system, respectively. In the thirdmethod, a phosphor screen is irradiated by a magnified e-beam spot and the current density distribution is represented by the luminescence image on the screen. The fourth method uses electron sensitive resist which is exposed by the e-beam. The developed resist is observed under a microscope and the current density distribution is judged fromthe resist profile. All the methods are demonstrated in an example, compared, and their spatial resolution and accuracy evaluated.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JB - Sensors, detecting elements, measurement and regulation

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronic Engineering

  • ISSN

    0167-9317

  • e-ISSN

  • Volume of the periodical

    149

  • Issue of the periodical within the volume

    JAN 5

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    8

  • Pages from-to

    117-124

  • UT code for WoS article

    000367420200021

  • EID of the result in the Scopus database

    2-s2.0-84944145588