Exchangeable scanning probe microscopy optical fiber tips

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F25%3A00648680" target="_blank" >RIV/68081731:_____/25:00648680 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26210/26:0200128

Result on the web

<a href="https://www.spiedigitallibrary.org/conference-proceedings-of-spie/13639/3060346/Exchangeable-scanning-probe-microscopy-optical-fiber-tips/10.1117/12.3060346.short" target="_blank" >https://www.spiedigitallibrary.org/conference-proceedings-of-spie/13639/3060346/Exchangeable-scanning-probe-microscopy-optical-fiber-tips/10.1117/12.3060346.short</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.3060346" target="_blank" >10.1117/12.3060346</a>

Result language

angličtina

Original language name

Exchangeable scanning probe microscopy optical fiber tips

Original language description

Correlative probe, electron, and near-field cathodoluminescence (CL) microscopy in scanning electron microscope (SEM) enables comprehensive sample characterization and chemical analysis, which are crucial for advancing novel material and nanotechnology research. In this technique, scanning near-field optical microscopy (SNOM) probe scans the sample simultaneously with the electron beam, enabling the acquisition of correlated images. However, the system's added complexity and the fragility of the implemented SNOM tip have yet limited the widespread adoption of this powerful technique combination. Here, we present a newly developed self-sensing quartz-based probe for the AFM-in-SEM solution LiteScopeT. This probe features an optical fiber with an exchangeable tip designed to address the tip fragility. This innovative probe-tip system allows seamless in situ SEM replacement of only the fragile tip at the optical fiber's end, without venting the vacuum chamber and replacing the entire probe. These exchangeable tips are fabricated in a stack on a silicon wafer using two-photon polymerization (TPP) and subsequently undergo post-process plasma etching to achieve an apex of elliptical cross-section with a semi-minor axis of 24 nm. Proof-of-concept CL and topography measurements are presented. The described socket for mounting the SNOM tip on the optical fiber is readily applicable to accommodate various other TPP 3D printable optical fiber terminations, such as micro-optical and mechanical elements, and sensors. The presented solution not only streamlines the workflow of the correlative probe, electron, and near-field CL microscopy but also broadens the applicability of optical fiber functionalization for diverse experimental setups.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

—

OECD FORD branch

10306 - Optics (including laser optics and quantum optics)

Project

—

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2025

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

29th International Conference on Optical Fiber Sensors

ISBN

978-1-5106-9187-2

ISSN

0277-786X

e-ISSN

1996-756X

Number of pages

4

Pages from-to

136394Z

Publisher name

SPIE

Place of publication

Bellingham

Event location

Porto

Event date

May 25, 2025

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

001517368300160