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Hardness and elastic modulus of amorphous and nanocrystalline SiC and Si films

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F08%3A00307730" target="_blank" >RIV/68378271:_____/08:00307730 - isvavai.cz</a>

  • Alternative codes found

    RIV/61989592:15310/08:00007691

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Hardness and elastic modulus of amorphous and nanocrystalline SiC and Si films

  • Original language description

    Hydrogen-free amorphous and nanocrystalline films were prepared by magnetron sputtering of the SiC or Si targets. Mechanical properties (hardness, elastic modulus, intrinsic stress) and film structures were investigated in dependence on the substrate bias and temperature. It was found that both hardness and elastic modulus of all amorphous a-SiC films prepared at different substrate temperatures and biases are always lower than those for bulk ?-SiC single crystal while the hardness of partially crystalline SiC films is higher and the elastic modulus lower than those for ?-SiC one. In contrast, both hardness and elastic modulus of all amorphous Si films are always lower than those for nanocrystalline Si films which show approximately the same value as the Si single crystal.

  • Czech name

    Tvrdost a modul pružnosti amorfních a nanokrystalických filmů SiC a Si

  • Czech description

    Vodíkuprosté amorfní a nanokrystalické filmy byly připraveny magnetronovým rozprašováním Targetů SiC a Si. V závislosti na "bias" a teplotě substrátů byly zkoumány jejich mechanické vlastnosti (tvrdost, modul pružnosti, vnitřní pnutí). Bylo zjištěno, žetvrdost a modul pružnosti všech amorfních a-SiC filmů byl menší než pro "bulk" ?-SiC monokrystalu. Částečně krystalické filmy SiC měly vyšší tvrdost a nižší modul pružnosti než ?-SiC. Naproti tomu amorfní filmy Si měly všechny tvrdost a modul pružnosti nižší než Si filmy nanokrystalické, které vykázaly přibližně tytéž hodnoty jako monokrystal Si.

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2008

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Surface and Coatings Technology

  • ISSN

    0257-8972

  • e-ISSN

  • Volume of the periodical

    202

  • Issue of the periodical within the volume

    -

  • Country of publishing house

    CH - SWITZERLAND

  • Number of pages

    8

  • Pages from-to

    1738-1745

  • UT code for WoS article

  • EID of the result in the Scopus database