Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00331262" target="_blank" >RIV/68378271:_____/09:00331262 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Nonlinear optical properties of silicon nanocrystals studied by ultrafast spectroscopy
Original language description
Starting with the demonstration of efficient photoluminescence of silicon nanocrystals, nanocrystalline silicon is ranked among the most studied semiconductor materials. Its main prospect is assigned to the possibility of constructing a silicon based laser, which could be easily integrated into present microelectronic chips. To attain higher optical gain it is necessary to investigate and identify processes in Si NCs. We investigated the processes extending time scales from hundreds of femtosecond to miliseconds, namely by up-conversion technique, by a streak camera and a PMT. We studied the processes in various Si NC systems, including also organically passivated NCs which allowed us to distinguish between intrinsic Si NC properties and effects of SiSiO2 interface. Time-resolved spectroscopy were extended by optical gain measurements and measurements of nonlinear properties by using two-photon absorption.
Czech name
—
Czech description
—
Classification
Type
O - Miscellaneous
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů