Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F10%3A00373735" target="_blank" >RIV/68378271:_____/10:00373735 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
Original language description
Thin films of microcrystalline silicon (?c-Si:H) are intensively studied mainly for thin film solar cells. All structural and material properties of ?c-Si:H significantly depend on the crystalline volume fraction and the crystallographic orientation of the grains.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2010
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
XXII International Conference on Raman Spectroscopy
ISBN
978-0-7354-0818-0
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
1109-1110
Publisher name
AIP
Place of publication
Melville
Event location
Boston
Event date
Aug 8, 2010
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000281210900584